Average Ratings 0 Ratings
Average Ratings 0 Ratings
Description
LogBook Discovery is a software solution tailored for quality control managers in manufacturing, enabling them to oversee both manual and automated data collection seamlessly. This comprehensive application includes features like "on the fly" test definitions, SPC charting, and a versatile report writer, making it ideal for laboratories focused on Total Quality Control. It facilitates automatic data collection from a variety of electronic devices, providing users with the flexibility to define tests and customize reports and graphs according to their specific requirements. Additionally, the custom report writer allows for the generation of individual, average, weekly, and monthly trend reports, and transforms any report into an SPC chart. With robust data import/export options, users can efficiently transfer data to MS Excel, Access, or SQL databases. To ensure data integrity, both manual and automatic data can be cross-referenced against stored UCL/LCL values and customer specifications, helping to identify quality issues before they lead to costly consequences. By streamlining the processes of collecting, storing, and entering test results through automation, the application significantly reduces time and costs associated with quality control management, ultimately enhancing overall operational efficiency. Furthermore, the user-friendly interface and extensive capabilities make it an essential tool for any quality-focused organization!
Description
SigmaXL was created from the ground up to provide a cost-effective, powerful and easy-to-use tool that allows users to measure, analyze and improve their service, transactional and manufacturing processes. SigmaXL can be used as an add-in to Microsoft Excel or for Lean Six Sigma training. Version 9 includes advanced control charts and time series forecasting. Click here to see all features in SigmaXL Automatic removal of extreme VIF and collinear terms (with an alias or removal report). Specify interactions and quadratic orders (all interactions and up to 3-Way). ANOVA Type I and/or III Sum-of–Squares with Pareto of Percent contribution and Standardized Effects. Lenth Pseudo Standard Error in Saturated Models (Orthogonal and Non-Orthogonal) with Monte Carlo P-Values or Student T P. White robust standard errors for non-constant variance (Heteroskedasticity-Consistent).
API Access
Has API
API Access
Has API
Integrations
No details available.
Integrations
No details available.
Pricing Details
No price information available.
Free Trial
Free Version
Pricing Details
$249.00/one-time/user
Free Trial
Free Version
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Vendor Details
Company Name
TechWare
Website
techwareinc.com/products/logbook-discovery/
Vendor Details
Company Name
SigmaXL
Founded
1998
Country
Canada
Website
www.sigmaxl.com
Product Features
SPC
Corrective Actions (CAPA)
Data Entry
Data Linking
Data Management
Excel Loader
Job Management
OPC Data Collection
Performance Metrics
Point-of-Production Analysis
Real Time Data Collection
Regulatory Compliance
Product Features
Data Analysis
Data Discovery
Data Visualization
High Volume Processing
Predictive Analytics
Regression Analysis
Sentiment Analysis
Statistical Modeling
Text Analytics
SPC
Corrective Actions (CAPA)
Data Entry
Data Linking
Data Management
Excel Loader
Job Management
OPC Data Collection
Performance Metrics
Point-of-Production Analysis
Real Time Data Collection
Regulatory Compliance
Statistical Analysis
Analytics
Association Discovery
Compliance Tracking
File Management
File Storage
Forecasting
Multivariate Analysis
Regression Analysis
Statistical Process Control
Statistical Simulation
Survival Analysis
Time Series
Visualization