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Average Ratings 0 Ratings

Total
ease
features
design
support

No User Reviews. Be the first to provide a review:

Write a Review

Description

Analyst XR is a cutting-edge software solution crafted by ScanTech Instruments designed for sophisticated C-scan corrosion mapping within non-destructive testing scenarios. It empowers users to create intricate 3D representations of pipes or vessels by seamlessly merging numerous scans, which allows for thorough examination and external review. With a user-friendly interface complemented by a calibration wizard, the software assists users in navigating their setup processes with precision. Additionally, real-time data monitoring facilitates on-the-spot adjustments during inspections, enhancing the efficiency of data collection. A notable feature is the re-gating function, which allows for modifications after scanning to remove any interference, thereby ensuring high accuracy in the resulting scan maps. Users can also take advantage of customizable reporting templates that support the generation of tailored reports, including various elements such as scan data, visuals, and explanatory text. Furthermore, Analyst XR conducts automated B31G analysis on the scan data, offering vital evaluations of structural integrity, which is crucial for maintaining safety and compliance in engineering assessments. Overall, Analyst XR not only streamlines the corrosion mapping process but also significantly improves the reliability of testing outcomes.

Description

JTAG Maps™, an intuitive Altium extension, allows engineers to quickly assess test possibilities provided by the JTAG devices in their design. Engineers used to spend hours manually highlighting boundary-scan nets in a design to determine coverage. Boundary scan device model files (BSDLs), which indicate exactly which pins can or cannot be controlled by JTAG/boundary scanning, are crucial to any JTAG/boundary scanner process. JTAG Maps is compatible with BSDL models, and has an 'assume scanner covered' option. Although most users will prefer to use the JTAG Maps Altium coverage report, it is possible import a more detailed picture. The data can be exported to JTAG ProVision for further analysis. A simple message file containing full fault-coverage information can then be read back into JTAG Maps for display/highlighting.

API Access

Has API

API Access

Has API

Screenshots View All

Screenshots View All

Integrations

Allegro X Design Platform
OrCAD X

Integrations

Allegro X Design Platform
OrCAD X

Pricing Details

No price information available.
Free Trial
Free Version

Pricing Details

No price information available.
Free Trial
Free Version

Deployment

Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook

Deployment

Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook

Customer Support

Business Hours
Live Rep (24/7)
Online Support

Customer Support

Business Hours
Live Rep (24/7)
Online Support

Types of Training

Training Docs
Webinars
Live Training (Online)
In Person

Types of Training

Training Docs
Webinars
Live Training (Online)
In Person

Vendor Details

Company Name

Scantech Instruments

Founded

1997

Country

United States

Website

scanndt.com/products/ndt-software/analyst-xr-software-for-c-scanning/

Vendor Details

Company Name

Altium

Founded

1985

Country

United States

Website

www.altium.com/products/extensions/platform-extensions/jtag-maps/overview

Product Features

PCB Design

3D Visualization
Autorouting
Collaboration Tools
Component Library
Design Rule Check
Differential Pair Routing
Schematic Editor

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