Analyst NDX Reviews

Analyst X, a sophisticated software for data analysis crafted by ScanTech Instruments, is specifically tailored for B-scan ultrasonic inspections within non-destructive testing environments. This innovative tool streamlines the reporting process by enabling users to create scan plans and B-scans effortlessly with a single click, while also allowing for the overlay of multiple B-scans which enhances detailed comparative evaluations. It produces comprehensive data tables that highlight the high, average, and low values for each individual scan and incorporates a re-gating feature that allows for the refinement of scan data after collection, resulting in polished and precise scan maps. Additionally, users can take advantage of automated statistical analyses on their scan data to derive insights. Analyst X is designed with an intuitive interface that includes guided calibration to support users during the setup process. It also facilitates automated data acquisition, offers adjustable gain settings either prior to or during scans, and provides real-time monitoring with instant adjustment options, along with the convenience of pausing and resuming scans as needed, making it an essential tool for accurate and efficient data analysis in the field. The combination of these features ensures that users can achieve high-quality results with minimal effort.