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Description
In 30 minutes, you can monitor your entire warehouse. Automated warehouse-to-BI lineage can identify downstream impacts. Trust can be lost in seconds and regained in months. With modern data-era observability, you can have peace of mind. It can be difficult to get the coverage you need with code-based tests. They take hours to create and maintain. Metaplane allows you to add hundreds of tests in minutes. Foundational tests (e.g. We support foundational tests (e.g. row counts, freshness and schema drift), more complicated tests (distribution shifts, nullness shiftings, enum modifications), custom SQL, as well as everything in between. Manual thresholds can take a while to set and quickly become outdated as your data changes. Our anomaly detection algorithms use historical metadata to detect outliers. To minimize alert fatigue, monitor what is important, while also taking into account seasonality, trends and feedback from your team. You can also override manual thresholds.
Description
In response to the stringent quality requirements set by the automotive sector, semiconductor manufacturers are increasingly adopting Part Average Testing (PAT) to bolster the reliability of their products. This method focuses on identifying and eliminating "outlier" components that may pass conventional testing yet display unusual traits, thereby mitigating long-term quality and reliability concerns. By performing statistical analyses on a range of devices and modifying the pass/fail thresholds, PAT enables the early detection of these problematic parts, ensuring that only the highest quality components are included in production shipments. While Part Average Testing (PAT), as outlined in the Automotive Electronics Council AEC-Q001-Rev C specifications, primarily addresses DPM techniques for normal (Gaussian) distributions, many real-world scenarios involve distributions that do not conform to this norm. Consequently, it is essential to employ tailored PAT outlier detection strategies to prevent significant yield losses or erroneous identifications of outliers. To meet these challenges, PAT-Man emerges as a robust solution for implementing effective Part Average Testing (PAT). This innovative tool not only enhances the reliability of semiconductor components but also streamlines the testing process, ultimately benefiting manufacturers and consumers alike.
API Access
Has API
API Access
Has API
Integrations
Amazon Redshift
ClickHouse
Gmail
Google Cloud BigQuery
Looker
Metabase
Mode
MySQL
Okta
PagerDuty
Integrations
Amazon Redshift
ClickHouse
Gmail
Google Cloud BigQuery
Looker
Metabase
Mode
MySQL
Okta
PagerDuty
Pricing Details
$825 per month
Free Trial
Free Version
Pricing Details
No price information available.
Free Trial
Free Version
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Vendor Details
Company Name
Metaplane
Country
United States
Website
www.metaplane.dev/
Vendor Details
Company Name
Galaxy
Country
United States
Website
www.galaxysemi.com/products/pat-man
Product Features
Data Lineage
Database Change Impact Analysis
Filter Lineage Links
Implicit Connection Discovery
Lineage Object Filtering
Object Lineage Tracing
Point-in-Time Visibility
User/Client/Target Connection Visibility
Visual & Text Lineage View
Data Quality
Address Validation
Data Deduplication
Data Discovery
Data Profililng
Master Data Management
Match & Merge
Metadata Management
Product Features
Engineering
2D Drawing
3D Modeling
Chemical Engineering
Civil Engineering
Collaboration
Design Analysis
Design Export
Document Management
Electrical Engineering
Mechanical Engineering
Mechatronics
Presentation Tools
Structural Engineering