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Average Ratings 0 Ratings
Description
Examinator-Pro, a blend of EXAMINe and translATOR, represents Galaxy's premier software offering tailored for semiconductor engineers. This innovative tool converts typical test data files into detailed reports while allowing users to interactively explore the data for in-depth root-cause analysis. Among its latest features are multi-variable corner-case characterization, accelerated life testing, and swift, adaptable queries on extensive datasets. By supporting various standard semiconductor data file formats, including STDF, GDF, CSV, and more than 120 datalog formats, it equips engineers to effortlessly perform device characterization, qualify test programs, analyze reliability, and conduct yield studies. As the gold standard in semiconductor data analysis, Examinator-Pro is utilized by over 8,500 engineers from fabless, IDM, and ATE companies. Typically, these professionals leverage Examinator-Pro to characterize early samples, ensuring product and test hardware qualification before ramping up production, thereby enhancing repeatability in their processes. The software's versatility and powerful analytical capabilities make it an indispensable tool in the semiconductor industry, driving efficiency and accuracy.
Description
In a secure and manageable setting, users can swiftly derive insights from their data. Data can be collected in various formats and types, enabling the creation of new variables and the selection of specific cases of interest. Through effective data analysis techniques, both numerical and categorical variables can be thoroughly examined and analyzed. Results can be presented either in tabular form or through graphical representations. Additionally, users can investigate the relationships between different variables and assess the significance of these relationships. Various statistical tests, such as Pearson and Spearman correlations, Chi-Square tests, T-Tests for independent samples, Mann-Whitney, ANOVA, and Kruskal-Wallis, can be employed to achieve this. Moreover, the most commonly used measures of scale reliability can be easily selected and calculated. One can also verify the consistency of dimensions in the dataset. Utilizing measures like Cronbach's Alpha—both raw and standardized, with or without item deletion—Guttman’s six, and Intraclass correlation coefficients (ICC), provides further insights into the reliability of the data. This comprehensive approach ensures a thorough understanding of the data's structure and relationships.
API Access
Has API
API Access
Has API
Integrations
Google Sheets
Microsoft Excel
Pricing Details
No price information available.
Free Trial
Free Version
Pricing Details
$29.90/month/user
Free Trial
Free Version
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Vendor Details
Company Name
Galaxy
Country
United States
Website
www.galaxysemi.com/products/examinatorpro
Vendor Details
Company Name
Quark Analytics
Founded
2019
Country
Portugal
Website
www.quarkanalytics.com
Product Features
Engineering
2D Drawing
3D Modeling
Chemical Engineering
Civil Engineering
Collaboration
Design Analysis
Design Export
Document Management
Electrical Engineering
Mechanical Engineering
Mechatronics
Presentation Tools
Structural Engineering
Product Features
Data Analysis
Data Discovery
Data Visualization
High Volume Processing
Predictive Analytics
Regression Analysis
Sentiment Analysis
Statistical Modeling
Text Analytics
Statistical Analysis
Analytics
Association Discovery
Compliance Tracking
File Management
File Storage
Forecasting
Multivariate Analysis
Regression Analysis
Statistical Process Control
Statistical Simulation
Survival Analysis
Time Series
Visualization