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Average Ratings 0 Ratings
Description
Examinator-Pro, a blend of EXAMINe and translATOR, represents Galaxy's premier software offering tailored for semiconductor engineers. This innovative tool converts typical test data files into detailed reports while allowing users to interactively explore the data for in-depth root-cause analysis. Among its latest features are multi-variable corner-case characterization, accelerated life testing, and swift, adaptable queries on extensive datasets. By supporting various standard semiconductor data file formats, including STDF, GDF, CSV, and more than 120 datalog formats, it equips engineers to effortlessly perform device characterization, qualify test programs, analyze reliability, and conduct yield studies. As the gold standard in semiconductor data analysis, Examinator-Pro is utilized by over 8,500 engineers from fabless, IDM, and ATE companies. Typically, these professionals leverage Examinator-Pro to characterize early samples, ensuring product and test hardware qualification before ramping up production, thereby enhancing repeatability in their processes. The software's versatility and powerful analytical capabilities make it an indispensable tool in the semiconductor industry, driving efficiency and accuracy.
Description
In response to the stringent quality requirements set by the automotive sector, semiconductor manufacturers are increasingly adopting Part Average Testing (PAT) to bolster the reliability of their products. This method focuses on identifying and eliminating "outlier" components that may pass conventional testing yet display unusual traits, thereby mitigating long-term quality and reliability concerns. By performing statistical analyses on a range of devices and modifying the pass/fail thresholds, PAT enables the early detection of these problematic parts, ensuring that only the highest quality components are included in production shipments. While Part Average Testing (PAT), as outlined in the Automotive Electronics Council AEC-Q001-Rev C specifications, primarily addresses DPM techniques for normal (Gaussian) distributions, many real-world scenarios involve distributions that do not conform to this norm. Consequently, it is essential to employ tailored PAT outlier detection strategies to prevent significant yield losses or erroneous identifications of outliers. To meet these challenges, PAT-Man emerges as a robust solution for implementing effective Part Average Testing (PAT). This innovative tool not only enhances the reliability of semiconductor components but also streamlines the testing process, ultimately benefiting manufacturers and consumers alike.
API Access
Has API
API Access
Has API
Integrations
Google Sheets
Microsoft Excel
Pricing Details
No price information available.
Free Trial
Free Version
Pricing Details
No price information available.
Free Trial
Free Version
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Vendor Details
Company Name
Galaxy
Country
United States
Website
www.galaxysemi.com/products/examinatorpro
Vendor Details
Company Name
Galaxy
Country
United States
Website
www.galaxysemi.com/products/pat-man
Product Features
Engineering
2D Drawing
3D Modeling
Chemical Engineering
Civil Engineering
Collaboration
Design Analysis
Design Export
Document Management
Electrical Engineering
Mechanical Engineering
Mechatronics
Presentation Tools
Structural Engineering
Product Features
Engineering
2D Drawing
3D Modeling
Chemical Engineering
Civil Engineering
Collaboration
Design Analysis
Design Export
Document Management
Electrical Engineering
Mechanical Engineering
Mechatronics
Presentation Tools
Structural Engineering