Average Ratings 0 Ratings
Average Ratings 0 Ratings
Description
Analyst X is an advanced software solution for data analysis created by ScanTech Instruments, specifically tailored for B-scan ultrasonic inspections within non-destructive testing scenarios. This powerful tool streamlines the reporting process by enabling users to generate both scan plans and B-scans effortlessly with a single click, while also allowing for the overlay of multiple B-scans, facilitating thorough comparative analysis. The software is capable of generating detailed data tables that present high, average, and low values for each scan, and features a re-gating function that allows for adjustments to scan data after collection, resulting in polished, clear scan maps. Additionally, it provides automated statistical analysis on the collected scan data to enhance insights. Analyst X is designed with a user-friendly interface that includes guided calibration assistance, ensuring a smooth calibration experience for users. It further supports automated data acquisition, offers adjustable gain modification either before or during scans, and provides real-time data monitoring with instant adjustment options, in addition to allowing scans to be paused and resumed seamlessly. This comprehensive functionality makes Analyst X an essential tool for professionals in the field.
Description
SystemLink streamlines the process of maintaining test systems, reducing the need for manual interventions. By automating updates and continuously monitoring system health, it provides essential insights that enhance situational awareness and readiness for testing, ultimately ensuring high-quality outcomes throughout the product lifecycle.
With SystemLink, you can confidently verify that software configurations are precise and that testing equipment meets all necessary calibration and quality regulations. Utilizing a robust automation and connectivity framework,
SystemLink consolidates all test and measurement data into a single, accessible data repository. This allows users to easily track asset usage, predict calibration needs, and review historical test results, trends, and production metrics, empowering them to make informed decisions regarding capital expenditures, maintenance schedules, and potential modifications to tests or products. Furthermore, this insight facilitates ongoing improvements and optimizations across the testing process.
API Access
Has API
API Access
Has API
Integrations
No details available.
Integrations
No details available.
Pricing Details
No price information available.
Free Trial
Free Version
Pricing Details
No price information available.
Free Trial
Free Version
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Vendor Details
Company Name
Scantech Instruments
Founded
1997
Country
United States
Website
scanndt.com/products/ndt-software/analyst-x-software-for-b-scanning/
Vendor Details
Company Name
NI
Founded
1976
Country
United States
Website
www.ni.com/en-us/shop/electronic-test-instrumentation/application-software-for-electronic-test-and-instrumentation-category/systemlink.html
Product Features
Product Features
Configuration Management
Access Control / Permissions
Application Deployment
Automated Provisioning
Infrastructure Automation
Node Management
Orchestration
Reporting Analytics / Visualization
Task Management
Data Preparation
Collaboration Tools
Data Access
Data Blending
Data Cleansing
Data Governance
Data Mashup
Data Modeling
Data Transformation
Machine Learning
Visual User Interface